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Mots clés
Epitaxial growth
7550Pp
17Opp
27Ald p&α
Gallium oxide
Topological defects
ADSORPTION DESORPTION HYSTERESIS
Ferromagnetic resonance
AFM
7630Lh
Passivation
Magnetic semiconductors
Sputtering
Aluminum
Thin films
Adsorption Isotherms
Interface defects
EPR
Nickel
Evaluation
Atomic Layer Deposition ALD
27Alda
Acoustic propreties of solid
Magnetization curves
Acoustic
Auger electron spectroscopy AES
Channeling
Density functional theory
Nitridation
Adsorbed layers
Stable isotopic tracing
PIXE
Ion beam analysis
ALD
18O
Hysteresis
Low energy electron diffraction LEED
GaMnAs
Pulsed laser deposition
Silicon
27Aldp
Measurement
15N
SiC
Oxidation
13C
Diffusion
Nuclear resonance profiling NRP
Pb centers
X-ray diffraction
Ageing
3C-SiC
18O resonance
Zinc oxide
Nanoparticles
HfO2
Transparent conductive oxide TCO
Nanostructures
Annealing
Charge exchange
Thin film
6855Jk
2H
Alloys
XPS
Silicon Carbide
Gold
17O
Nuclear reaction analysis
17Op
XRD
Epitaxy
AC susceptibility
Silicon carbide
Raman spectroscopy
Multilayer
Photoluminescence
7550Ee
Oxygen deficiency
Al2O3
Silica
Indium oxide
Capillary condensation
RBS
Periodic multilayer
8140Ef
Adsorption
Metal-insulator transition
Ion implantation
NRP
Magnetic anisotropy
Isotopic Tracing
Rutherford backscattering spectrometry RBS
Aluminium
Energy loss
Growth
Defects
Topological insulators
Alloy
Kossel diffraction