Communication Dans Un Congrès Année : 2007

The Silicon Environment in Silica Polymorphs, Aluminosilicate Crystals and Melts: An In Situ High Temperature XAS Study

Résumé

High temperature X-ray absorption spectroscopy at the Si K-edge has been used to obtain in situ information on SiO2 phase transitions upon heating. Important modifications are observed for the XANES spectra of the high temperature polymorphs, in relation to disordering of the SiO4 tetrahedra beyond the short-range correlations. This paper also presents the XANES spectra of anorthite (CaAl2Si2O8) from room temperature up to the melt (1900 K). This study shows the possibilities for determining the Si environment in crystals and glasses up to the liquid state using in situ XANES measurements.

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Dates et versions

insu-03603197 , version 1 (09-03-2022)

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L. Cormier, D. R. Neuville, J. Roux, D. de Ligny, G. S. Henderson, et al.. The Silicon Environment in Silica Polymorphs, Aluminosilicate Crystals and Melts: An In Situ High Temperature XAS Study. X-Ray Absorption Fine Structure - XAFS13: 13th International Conference. Proceedings held at Stanford, 2007, à renseigner, Unknown Region. pp.416-418, ⟨10.1063/1.2644544⟩. ⟨insu-03603197⟩
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