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QCM UE3 Physique - Semestre 1: Organisation des appareils et des systèmes2011
Books
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Caractérisation d'un système fritté de nanoparticules d'argent par Analyses Spectroscopiques ComplémentaireSociété Française de Physique, Congrès Général, Jul 2009, Ecole Polytechnique, Palaiseau, France
Conference poster
hal-00673356v1
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Spectroscopic Ellipsometry Study of Spark Plasma Sintered Nano Silver7th International Conference on Spectroscopic Ellipsometry (ICSE-7), Jun 2016, Berlin, Germany
Conference papers
insu-01314044v1
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Comparison of NIR to MIR Optical Constants of Polymers for Packaging by Spectroscopic Ellipsometry7th International Conference on Spectroscopic Ellipsometry (ICSE-7), Jun 2016, Berlin, Germany
Conference papers
insu-01314090v1
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Impact of voids in interconnection materialsAbdelkhalak El Hami et Philippe Pougnet. Embedded Mechatronic Systems 2. Analysis of Failures, Modeling, Simulation and Optimization, Elsevier, Chapter 4, 2015, ISBN : 978-1-78548-014-0. ⟨10.1016/B978-1-78548-014-0.50004-9⟩
Book sections
insu-01154803v1
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Propriétés Physiques d'interconnexion élaborées par frittage de particules d'argent nanométriques et micrométriquesPAMO-JSM 2010: Colloque commun de la division de Physique Atomique et Moléculaire et Optique de la SFP et des Journées de Spectroscopie Moléculaire, Jun 2010, Orsay, France
Conference poster
hal-00673131v1
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Real time characterization of pulsed laser deposition of SmFeO3 thin films by ellipsometry: Anomalous temperature effects and growth ratesVth International Conference on Spectroscopic Ellipsometry, (ICSE-V), May 2010, Albany, United States
Conference poster
hal-00672973v1
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Physical characterization of silver material sintered by SPS technique used as material connection in power electronicsEuromat 2011, (European Congress on Advanced Materials and Processes), Sep 2011, Montpellier, France
Conference papers
hal-00673061v1
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Reliabilty in mechatronic systems from TEM , SEM and SE material analysisReliability and Materials Issues of Semiconductor Optical and Electrical Devices and Material, MRS Proceedings, Vol 1195, 2009, Warrendale, United States. 1195-B07-04 (4 p.), ⟨10.1557/PROC-1195-B07-04⟩
Conference papers
hal-00671699v1
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Caractérisation du frittage de particules d'argent dans un système électronique de puissance,Matériaux 2010, Oct 2010, Nantes, France
Conference papers
hal-00673176v1
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Investigating Substrate Effect on the Optical Properties of Thick Polymers by Spectroscopic Ellipsometry7th International Conference on Spectroscopic Ellipsometry (ICSE-7), Jun 2016, Berlin, Germany
Conference papers
insu-01314097v1
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Spark Plasma Sintering constrained process parameters of sintered silver paste for connection in power electronic modules: Microstructure, mechanical and thermal propertiesMaterials Chemistry and Physics, 2014, 148 (1-2), pp.125-133. ⟨10.1016/j.matchemphys.2014.07.021⟩
Journal articles
hal-01025780v1
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Effet de défauts lacunaires dans les matériaux d’interconnexionAbdelkhalak El Hami et Philippe Pougnet. Les systèmes mécatroniques embarqués 2. Analyse des causes de défaillances, modélisation, simulation et optimisation, 2, ISTE éditions, Chapitre 4, pp. 99-122, 2015, Collection: Génie mécanique et mécanique des solides, 978-1-78405-059-7
Book sections
hal-01114117v1
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Thin films of SmFeO3 on quartz substrate modelled as anisotropic optical materialVth International Conference on Spectroscopic Ellipsometry, (ICSE-V), May 2010, Albany, United States
Conference poster
hal-00672737v1
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