Highly Accelerated Testing - INSU - Institut national des sciences de l'Univers Access content directly
Book Sections Year : 2015
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insu-01154806 , version 1 (23-05-2015)

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  • HAL Id : insu-01154806 , version 1

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Philippe Pougnet, Pierre-Richard Dahoo, Jean-Loup Alavarez. Highly Accelerated Testing. Abdelkhalak El Hami et Philippe Pougnet. Embedded Mechatronic Systems 2. Analysis of Failures, Modeling, Simulation and Optimization, Elsevier, Chapter 1, 2015, ISBN : 978-1-78548-014-0. ⟨insu-01154806⟩
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