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Year : 2015
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https://insu.hal.science/insu-01154806
Submitted on : Saturday, May 23, 2015-6:01:52 PM
Last modification on : Monday, December 2, 2024-2:48:12 PM
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- HAL Id : insu-01154806 , version 1
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Philippe Pougnet, Pierre-Richard Dahoo, Jean-Loup Alavarez. Highly Accelerated Testing. Abdelkhalak El Hami et Philippe Pougnet. Embedded Mechatronic Systems 2. Analysis of Failures, Modeling, Simulation and Optimization, Elsevier, Chapter 1, 2015, ISBN : 978-1-78548-014-0. ⟨insu-01154806⟩
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