Reliability Prediction of embedded Electronic Systems: The FIDES Guide - INSU - Institut national des sciences de l'Univers
Book Sections Year : 2015

Reliability Prediction of embedded Electronic Systems: The FIDES Guide

Philippe Pougnet
  • Function : Author
Valeo Powertrain Systems
Franck Bayle
  • Function : Author
Thales Avionics
Hichame Maanane
  • Function : Author
Thales Air Systems
Pierre-Richard Dahoo
  • Function : Author
PLANETO - LATMOS

Domains

Instrumentation and Methods for Astrophysic [astro-ph.IM] Materials and structures in mechanics [physics.class-ph]

Catherine Cardon  : Connect in order to contact the contributor

https://insu.hal.science/insu-01155286

Submitted on : Tuesday, May 26, 2015-1:57:15 PM

Last modification on : Monday, December 2, 2024-2:48:12 PM

No file

Dates and versions

insu-01155286 , version 1 (26-05-2015)

Identifiers

  • HAL Id : insu-01155286 , version 1

Cite

Philippe Pougnet, Franck Bayle, Hichame Maanane, Pierre-Richard Dahoo. Reliability Prediction of embedded Electronic Systems: The FIDES Guide. Abdelkhalak El Hami et Philippe Pougnet. Embedded Mechatronic Systems 1. Analysis of Failures, Predictive Reliability, Elsevier, Chapter 8, 2015, 978-1-78548-013-3. ⟨insu-01155286⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

INSU UPMC CNRS LATMOS UVSQ UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE SU-SCIENCES GS-PHYSIQUE INSTITUT-SCIENCES-LUMIERE
162 View
0 Download

Share

More