Reliability Prediction of embedded Electronic Systems: The FIDES Guide - INSU - Institut national des sciences de l'Univers
Book Sections Year : 2015
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insu-01155286 , version 1 (26-05-2015)

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  • HAL Id : insu-01155286 , version 1

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Philippe Pougnet, Franck Bayle, Hichame Maanane, Pierre-Richard Dahoo. Reliability Prediction of embedded Electronic Systems: The FIDES Guide. Abdelkhalak El Hami et Philippe Pougnet. Embedded Mechatronic Systems 1. Analysis of Failures, Predictive Reliability, Elsevier, Chapter 8, 2015, 978-1-78548-013-3. ⟨insu-01155286⟩
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