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Book Sections Year : 2015

Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices

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Instrumentation and Methods for Astrophysic [astro-ph.IM] Materials and structures in mechanics [physics.class-ph]

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https://insu.hal.science/insu-01155342

Submitted on : Tuesday, May 26, 2015-2:47:23 PM

Last modification on : Thursday, December 21, 2023-11:56:08 AM

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insu-01155342 , version 1 (26-05-2015)

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Pierre-Richard Dahoo, Malika Khettab, Jorge Linares, Philippe Pougnet. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices. Abdelkhalak El Hami et Philippe Pougnet. Embedded Mechatronic Systems 1. Analysis of Failures, Predictive Reliability, Elsevier, Chapter 2, 2015, 978-1-78548-013-3. ⟨10.1016/B978-1-78548-013-3.50002-4⟩. ⟨insu-01155342⟩

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