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Conference Papers Year : 2016

Spectroscopic Ellipsometry Study of Spark Plasma Sintered Nano Silver

Abstract

Spark Plasma Sintered (SPS) silver layers were studied by Spectroscopic Ellipsometry (SE) using an M-2000V spectroscopic ellipsometer from J. A. Woollam Co., Inc. which operate in rotating compensator mode
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Dates and versions

insu-01314044 , version 1 (10-05-2016)

Identifiers

  • HAL Id : insu-01314044 , version 1

Cite

Christian Chong, Armelle Girard, Nadim Alayli, Frédéric Schoenstein, Pierre-Richard Dahoo. Spectroscopic Ellipsometry Study of Spark Plasma Sintered Nano Silver. 7th International Conference on Spectroscopic Ellipsometry (ICSE-7), Jun 2016, Berlin, Germany. ⟨insu-01314044⟩
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