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Books Year : 2016

Nanometer-scale Defect Detection Using Polarized Light

Pierre-Richard Dahoo
  • Function : Author
  • PersonId : 921036
Abdelkhalak El-Hami
  • Function : Author
  • PersonId : 923151

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insu-01333788 , version 1 (19-06-2016)

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  • HAL Id : insu-01333788 , version 1

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Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El-Hami. Nanometer-scale Defect Detection Using Polarized Light. ISTE Editions, 200 p., 2016, 10 1848219369. ⟨insu-01333788⟩
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